dc.contributor.author | Nooshien Laderian, Arash Daghighi | |
dc.date.accessioned | 2021-12-11T10:01:49Z | |
dc.date.available | 2021-12-11T10:01:49Z | |
dc.date.issued | 2018 | |
dc.identifier.uri | ${sadil.baseUrl}/handle/123456789/1873 | |
dc.title | Investigation and Comparison of the DIBL Parameter and Thermal Effects of SOD Transistors and SOI Transistors and Improving Them with the Change of Their BOX Thicknesses | |
dc.type | Journal |